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21by Badessa, R. S., Bates, V. J., Searle, Campbell L., Kukolich, S. G., Golub, R., Guttrich, G. L., Johnston, W. D., Jr.Get full text
Published 2010
Technical Report -
22by Searle, Campbell L., Badessa, R. S., Bates, V. J., Buhl, D., Cogdell, J. R., Kent, R. L., Rennick, R. C.Get full text
Published 2010
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23by Searle, Campbell L., Badessa, R. S., Bates, V. J., Buhl, D., Cogdell, J. R., Kent, R. L., Rennick, R. C.Get full text
Published 2010
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24by King, J. G., Zacharias, J. R., DiBartolo, B., Ketudat, S., Stroke, G. W., Searle, Campbell L., Hilar, E. P.Get full text
Published 2010
Technical Report -
25by Bose, A. G., Bruce, J. D., Searle, Campbell L., Zimmermann, Henry J., Cuddy, David R., Tenney, R., Boddie, J. R.Get full text
Published 2010
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26by Zacharias, J. R., King, J. G., Harrison, G. R., Stroke, G. W., Mason, Samuel J., Searle, Campbell L., Schwartz, C. L.Get full text
Published 2010
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27by Zacharias, J. R., King, J. G., Searle, Campbell L., Brown, H. H., Jr., Badessa, R. S., Bates, V. J., Steelman, J. E.Get full text
Published 2010
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28by Bose, A. G., Bruce, J. D., Oppenheim, Alan V., Searle, Campbell L., Zimmermann, Henry J., Feldman, D. A., Bourne, J. B.Get full text
Published 2010
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29by Bose, A. G., Bruce, J. D., Nelsen, D. E., Oppenheim, Alan V., Searle, Campbell L., Zimmermann, Henry J., Bruce-Lockhart, M. P.Get full text
Published 2010
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30by King, J. G., Zacharias, J. R., Searle, Campbell L., Badessa, R. S., Bates, V. J., Buhl, D., Kent, R. L., Steelman, J. E.Get full text
Published 2010
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31by Searle, Campbell L., Diamond, B. L., Schwab, W. C., Huibonhoa, R., Andreika, J. T., Zimmermann, Henry J., Mason, Samuel J., Thornton, R. D.Get full text
Published 2010
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32by Yaffee, M. A., Brown, D. A., Funkhouser, A. T., Stroke, G. W., Steelman, J. E., Searle, Campbell L., Badessa, R. S., Bates, V. J.Get full text
Published 2010
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33by Bose, A. G., Bruce, J. D., Nelsen, D. E., Oppenheim, Alan V., Searle, Campbell L., Zimmermann, Henry J., Stockwell, R. K., Bourne, J. B.Get full text
Published 2010
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34by Zacharias, J. R., Stroke, G. W., Searle, Campbell L., Mason, Samuel J., Schwartz, C. L., Holloway, J. H., Aubrey, B. B., King, J. G., McRae, D. D.Get full text
Published 2010
Technical Report -
35by Zacharias, J. R., King, John G., Searle, Campbell L., Weiss, Rainer, Kukolich, S. G., Golub, R., Brabson, B., Johnston, W. D., Jr., Stroke, G. W., Yaffee, M. A., Bates, V. J., Funkhouser, A. T.Get full text
Published 2010
Technical Report -
36by Billman, K. W., Kukolich, S. G., Golub, R., Searle, Campbell L., Guttrich, G. L., Badessa, R. S., Thornburg, C. O., Jr., Yaffee, M. A., Culter, L. S., Taylor, E. F., Johnston, W. D., Jr., Zacharias, J. R., King, J. G.Get full text
Published 2010
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37by Yaffee, M. A., Taylor, E. F., Kukolich, S. G., Posner, R. D., Searle, Campbell L., Golub, R., Badessa, R. S., Thornburg, C. O., Jr., Guttrich, G. L., Brenner, J. F., Johnston, W. D., Jr., Billman, K. W., Zacharias, J. R., King, J. G.Get full text
Published 2010
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38by Peake, William T., Weiss, Thomas F., Braida, Louis D., Durlach, Nathaniel I., Colburn, H. Steven, Searle, Campbell L., Goldstein, J. L., Rabinowitz, William M., Frishkopf, Lawrence S., Oman, Charles M., Siebert, William M., Davis, James L., Burns, S. K., Mark, R. G., Hall, Robert D., Houtsma, Adrian J. M.Get full text
Published 2010
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39by Siebert, William M., Peake, William T., Weiss, Thomas F., Braida, Louis D., Durlach, Nathaniel I., Lim, Jae S., Purks, Steven R., Rabinowitz, William M., Singer, Elliot, Colburn, H. Steven, Domnitz, Robert H., Esquissaud, Phillipe, Shepard, Neil T., Stern, Richard M., Jr., Walkowski, Yvonne M., Schultz, Martin C., Bahler, Lawrence G., Beguesse, Ian M., Gluss, David H., Hicks, Bruce L., Lippmann, Richard P., Besen, Peter D., Golub, Howard L., Ingard, K. Uno, Houtsma, Adrian J. M., Henke, William L., Chow, Mark D., Boland, Robert P. W., Allen, John S., Willett, John C., Searle, Campbell L., Cuddy, David R., Davis, Mark F., Freeman, Dennis M., Krasner, Michael A., Frishkopf, Lawrence S., Oman, Charles M., Baden-Kristensen, Keld, Tole, John R., Wiegner, Allen W., Conrad, Chester H., Walters, Joseph B., Jr.Get full text
Published 2010
Technical Report