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6by Neben, Abraham Richard, Lonsdale, Colin John, McWhirter, Stephen R., Williams, Christopher Leigh, Hewitt, Jacqueline N, Dillon, Joshua Shane, Cappallo, Roger J, Corey, Brian E, Goeke, Robert F, Morgan, Edward HGet full text
Published 2016
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7by Liu, Adrian Chi-Yan, Ewall-Wice, Aaron Michael, Hewitt, Jacqueline N., Morales, Miguel F., Parsons, Aaron R., Dillon, Joshua Shane, Tegmark, Max Erik, Neben, Abraham Richard, Zheng, Haoxuan, Ph. D. Massachusetts Institute of TechnologyGet full text
Published 2015
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8by Lonsdale, Colin John, McWhirter, Stephen R., Dillon, Joshua Shane, Ewall-Wice, Aaron Michael, Feng, Lu, Neben, Abraham Richard, Tegmark, Max Erik, Williams, Christopher Leigh, Cappallo, Roger J, Hewitt, Jacqueline N, Morgan, Edward HGet full text
Published 2015
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9by Dillon, Joshua Shane, Ewall-Wice, Aaron Michael, Feng, Lu, Lonsdale, Colin John, McWhirter, Stephen R., Neben, Abraham Richard, Tegmark, Max Erik, Williams, Christopher Leigh, Cappallo, Roger J, de Oliveira Costa, Angelica, Hewitt, Jacqueline N, Morgan, Edward HGet full text
Published 2015
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10by Pober, Jonathan C., Liu, Adrian Chi-Yan, Aguirre, James E., Bowman, Judd D., Bradley, Richard F., Carilli, Chris L., DeBoer, David R., Jacobs, Daniel C., McQuinn, Matthew, Morales, Miguel F., Parsons, Aaron R., Werthimer, Dan J., Dillon, Joshua Shane, Tegmark, Max Erik, Hewitt, Jacqueline NGet full text
Published 2014
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11by Liu, Adrian Chi-Yan, Hewitt, Jacqueline N., Morgan, Edward H., Levine, Alan M., Morales, Miguel F., Tingay, Steven J., Bernardi, G., Bowman, Judd D., Briggs, Frank H., Emrich, David, Mitchell, Daniel A., Oberoi, Divya, Prabu, Thiagaraj, Wayth, Randall, Webster, Rachel L., Dillon, Joshua Shane, Williams, Christopher Leigh, Tegmark, Max Erik, Cappallo, Roger J.Get full text
Published 2014
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12by Cappallo, Roger J., Corey, Brian E., de Oliveira-Costa, Angelica, Dillon, Joshua Shane, Ewall-Wice, Aaron Michael, Feng, L., Goeke, Robert F., Hewitt, Jacqueline N., Kratzenberg, Eric W., Lonsdale, Colin John, McWhirter, Stephen R., Morgan, Edward H., Neben, Abraham Richard, Rogers, Alan E. E., Tegmark, Max Erik, Whitney, Alan R., Williams, Christopher LeighGet full text
Published 2015
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13by Cappallo, Roger J, Corey, Brian E, de Oliveira Costa, Angelica, Dillon, Joshua Shane, Ewall-Wice, Aaron Michael, Feng, Lu, Goeke, Robert F, Hewitt, Jacqueline N, Morgan, Edward H, Tegmark, Max Erik, Whitney, Alan R, Kratzenberg, Eric W, Lonsdale, Colin John, McWhirter, Stephen R., Rogers, Alan E E, Neben, Abraham Richard, Williams, Christopher LeighGet full text
Published 2017
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14by Bradley, Richard, Deboer, David, Parsons, Aaron, Aguirre, James, Ali, Zaki S., Bowman, Judd, Cheng, Carina, Patra, Nipanjana, Thyagarajan, Nithyanandan, Venter, Mariet, Acedo, Eloy de Lera, Dillon, Joshua S., Dickenson, Roger, Doolittle, Phillip, Egan, Dennis, Hedrick, Mike, Klima, Patricia, Kohn, Saul, Schaffner, Patrick, Shelton, John, Saliwanchik, Benjamin, Taylor, H. A., Taylor, Rusty, Wirt, Butch, Ewall-Wice, Aaron Michael, Hewitt, Jacqueline N, Neben, Abraham Richard, Tegmark, Max ErikGet full text
Published 2017
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15by Liu, A., Bradley, R. F., Hickish, J., Sanchez, N., Zarb Adami, K., Zheng, Haoxuan, Tegmark, Max Erik, Dillon, Joshua Shane, Neben, Abraham Richard, Tribiano, Shana, Buza, Victor, Ewall-Wice, Aaron Michael, Gharibyan, Hrant, Losh, Jonathan L, Kunz, Eben A, Lutomirski, Andrew Michael, Morgan, Edward H, Narayanan, Siddharth Madhavan, Perko, Ashley N, Rosner, Devon J., Valdez, Melinda, Villasenor, Jesus Noel Samonte, Yang, Hong, Zelko, Ioana A., Zheng, K., Schutz, KatelinGet full text
Published 2017
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16The Hydrogen Epoch of Reionization Array Dish. I. Beam Pattern Measurements and Science Implicationsby Bradley, Richard F., DeBoer, David R., Parsons, Aaron R., Aguirre, James E., Ali, Zaki S., Cheng, Carina, Patra, Nipanjana, Thyagarajan, Nithyanandan, Bowman, Judd, Dickenson, Roger, Dillon, Joshua S., Doolittle, Phillip, Egan, Dennis, Hedrick, Mike, Jacobs, Daniel C., Kohn, Saul A., Klima, Patricia J., Moodley, Kavilan, Saliwanchik, Benjamin R. B., Schaffner, Patrick, Shelton, John, Taylor, H. A., Taylor, Rusty, Wirt, Butch, Neben, Abraham Richard, Hewitt, Jacqueline N, Ewall-Wice, Aaron Michael, Tegmark, Max Erik, Zheng, HaoxuanGet full text
Published 2016
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17by Tegmark, Max Erik, Buza, Victor, Dillon, Joshua Shane, Gharibyan, Hrant, Kunz, Eben A., Liu, Adrian Chi-Yan, Losh, Jonathan L., Lutomirksi, Andy, Morrison, Scott D., Narayanan, Sruthi A., Perko, Ashley, Rosner, Devon, Sanchez, Nevada, Schutz, Katelin, Tribiano, Shana, Valdez, Michael, Zelko, Ioana, Zheng, Kevin, Ewall-Wice, Aaron Michael, Matejek, Michael Scott, Morgan, Edward H., Neben, Abraham Richard, Pan, Qinxuan, Penna, Robert, Su, Meng, Villasenor, Joel, Williams, Christopher Leigh, Yang, Hung-I, Zhu, Yan, Zheng, Haoxuan, Ph. D. Massachusetts Institute of TechnologyGet full text
Published 2014
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18by Tegmark, Max Erik, Buza, Victor, Dillon, Joshua Shane, Gharibyan, Hrant, Kunz, Eben A., Liu, Adrian Chi-Yan, Losh, Jonathan L., Lutomirski, Andrew Michael, Morrison, Scott D., Narayanan, Siddharth Madhavan, Perko, Ashley, Rosner, Devin, Sanchez, N., Schutz, Katharine, Tribiano, Shana M., Valdez, M., Yang, H., Zelko, Ioana, Zheng, K., Armstrong, R. P., Ewall-Wice, Aaron Michael, Matejek, Michael Scott, Morgan, Edward H., Neben, Abraham Richard, Pan, Qinxuan, Penna, Robert, Su, Meng, Villasenor, Jesus Noel Samonte, Williams, Christopher Leigh, Zhu, Y., Zheng, Haoxuan, Ph. D. Massachusetts Institute of TechnologyGet full text
Published 2015
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19by Offringa, A. R., Trott, C. M., Hurley-Walker, N., Johnston-Hollitt, M., McKinley, B., Barry, N., Beardsley, A. P., Bowman, J. D., Briggs, F., Carroll, P., Gaensler, B. M., Greenhill, L. J., Hazelton, B. J., Jacobs, D. C., Kim, H.-S., Kittiwisit, P., Lenc, E., Line, J., Loeb, A., Mitchell, D. A., Morales, M. F., Paul, S., Pindor, B., Pober, J. C., Procopio, P., Riding, J., Sethi, S. K., Shankar, N. U., Subrahmanyan, R., Sullivan, I. S., Thyagarajan, N., Tingay, S. J., Wayth, R. B., Webster, R. L., Wyithe, J. S. B., Dillon, Joshua Shane, Ewall-Wice, Aaron Michael, Feng, Lu, Hewitt, Jacqueline N, Neben, Abraham Richard, Tegmark, Max ErikGet full text
Published 2017
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20by Trott, C. M., Pindor, B., Procopio, P., Wayth, R. B., Mitchell, D. A., McKinley, B., Tingay, S. J., Barry, N., Beardsley, A. P., Bernardi, G., Bowman, Judd D., Briggs, F., Cappallo, R. J., Carroll, P., Greenhill, L. J., Hazelton, B. J., Hurley-Walker, N., Johnston-Hollitt, M., Jacobs, Daniel C., Kaplan, D. L., Kim, H. S., Lenc, E., Line, J., Loeb, A., Lonsdale, C. J., Morales, M. F., Thyagarajan, Nithyanandan, Oberoi, D., Offringa, A. R., Ord, S. M., Paul, S., Pober, J. C., Prabu, T., Riding, J., Shankar, N. Udaya, Sethi, Shiv K., Srivani, K. S., Subrahmanyan, R., Sullivan, I. S., Webster, R. L., Williams, A., Williams, C. L., Wu, C., Wyithe, J. S. B., de Oliveira Costa, Angelica, Dillon, Joshua Shane, Ewall-Wice, Aaron Michael, Feng, Lu, Hewitt, Jacqueline N, Morgan, Edward H, Neben, Abraham Richard, Tegmark, Max ErikGet full text
Published 2018
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