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5by Elias, Peter, Fano, R. M., Huffman, D. A., Wozencraft, J. M., Youngblood, W. A., Epstein, Michael A.Get full text
Published 2010
Technical Report -
6by Fano, R. M., Huffman, D. A., Schreiber, William F., Wozencraft, J. M., Tretiak, O. J., Wojnar, A.Get full text
Published 2010
Technical Report -
7by Arthurs, E., Elias, Peter, Fano, R. M., Huffman, D. A., Reiffen, B., Epstein, Michael A., Mongold, G. E., Jr.Get full text
Published 2010
Technical Report -
8by Tuller, W. G., Gilbert, Eric, Zaffarano, F. P., Fano, R. M., Cerrillo, Manuel V., Redheffer, R. M., Zabel, C. W., Gray, T. S.Get full text
Published 2009
Technical Report -
9by Macnee, A. B., Bowes, Henry N., Cerrillo, Manuel V., Scott, R. E., Wiesner, Jerome B., Goldman, Stanford, Fano, R. M., Redheffer, R. M., David, E. E., Jr., Wallman, HenryGet full text
Published 2010
Technical Report -
10by Macnee, A. B., Bowes, Henry N., Fano, R. M., Scott, R. E., Wiesner, Jerome B., Goldman, Stanford, Redheffer, R. M., Lee, Y. W., David, E. E., Jr., Wallman, HenryGet full text
Published 2010
Technical Report -
11by Cerrillo, Manuel V., Fano, R. M., Guillemin, Ernst A., Macnee, A. B., Scott, R. E., Lee, Y. W., Redheffer, R. M., Wiesner, Jerome B., David, E. E., Jr., Wallman, Henry, Goldman, StanfordGet full text
Published 2010
Technical Report -
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13by Arthurs, E., Elias, Peter, Fano, R. M., Huffman, D. A., Wozencraft, J. M., Peterson, W. W., Kailath, T., Zeiger, H. P., Hennie, F. C., III, Siebert, William M., Stiglitz, I. G., Reich, D. L., Ernst, H. A.Get full text
Published 2010
Technical Report -
14by Caldwell, S. H., Capon, J., Silverman, R. A., Elias, Peter, Ferretti, E., Stoddard, J. C., Fano, R. M., McCluskey, E. J., Jr., Tung, F. F., Huffman, D. A., Osborne, A. J., Unger, S. H., Breckenridge, W. G., Youngblood, W. A.Get full text
Published 2010
Technical Report -
15by Tuller, W. G., Cerrillo, Manuel V., Galloway, W. C., Arguimbau, Lawrence B., Richman, P. L., Cheatham, T. P., Jr., Zaffarano, F. P., Gray, T. S., Granlund, John, Stannard, G. E., Zabel, C. W., Fano, R. M., Redheffer, R. M., Kretzmer, E. R.Get full text
Published 2009
Technical Report -
16by Wiesner, Jerome B., Redheffer, R. M., Goldman, Stanford, Guillemin, Ernst A., Bowes, Henry N., Wallman, Henry, Scott, R. E., Macnee, A. B., Chu, L. J., Cerrillo, Manuel V., Fano, R. M., Winter, D. F., Luttinger, J. M., David, E. E., Jr.Get full text
Published 2010
Technical Report -
17by Dolansky, L., Arguimbau, Lawrence B., Powers, D. M., Fano, R. M., Cohen, R., Guillemin, Ernst A., Wiesner, Jerome B., Goldman, Stanford, Cheatham, T. P., Jr., Lee, Y. M., Galloway, W. C., Granlund, John, Hatton, W. L., Duvall, E. R., Kretzmer, E. R.Get full text
Published 2010
Technical Report -
18by Howland, Bradford H., Kautz, W. H., Reintjes, J. Francis, Jr., Manna, E. E., Linvill, J. G., Arguimbau, Lawrence B., Levin, M. J., Stuart, R. D., Desoer, C. A., Guillemin, Ernst A., Basore, B. A., Stutt, C. A., Rodgers, G. M., Bennett, R. K., Fano, R. M., Granlund, John, Weinberg, L., Lee, Y. W., Paananen, R. A., Wiesner, Jerome B.
Published 2010Technical Report -
19by Kittel, C., Roth, W., Debs, R. J., Squire, C. F., Harvey, George G., Plotkin, M., Moreno, T., Mason, Samuel J., Bostick, W. H., Polk, I., Fano, R. M., Maier, L. C., Jr., Demos, P. T., Terrall, J. R., Rapuano, R. A., Pellam, J. R., Galt, J. K., Slater, J. C., Kip, A. F., Adler, Richard B., Cohen, R.Get full text
Published 2010
Technical Report -
20by Singleton, H. E., Kraft, L. G., Jr., Fano, R. M., Lephakis, A. J., Wiesner, Jerome B., Granlund, John, Stutt, C. A., Dolansky, L., Smullin, Louis D., Lee, Y. W., Hummer, J. L., Guillemin, Ernst A., Cowley, P. E. A., Hatton, W. L., Jensen, J., Cheatham, T. P., Jr., Kautz, W. H., Davenport, Wilbur B., Jr., Levine, L., Cerrillo, Manuel V., Weinberg, L.Get full text
Published 2010
Technical Report