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7by Allen, Jonathan, Devadas, Srinivas, Wyatt, John L., Jr., Horn, Berthold K. P., Lee, Hae-Seung, Sodini, Charles G., Masaki, Ichiro, Rizzo, Joseph F., III, Terman, Christopher J., Socha, Michael, Shahin, Mohamed, Shire, Douglas, Howard, James, Herndon, Terry O., Jensen, Ralph, Loewenstein, John, LeBlanc, Danielle, Grumet, Andrew E., Lichtenstein, Bradley J., Kelly, Shawn G., Moss, Joshua D., Yeddanapudi, Neelima, Cheng, Haigian, Fang, Yajun, Love, Nicole S., Serafini, Pablo A., Spaeth, Mark G., Talib, Zubair, Wang, Ching-Chun, Engels, Daniel W., Hadjiyiannis, George I., Hanono, Silvina Z., Fallah, FarzanGet full text
Published 2010
Technical Report -
8by Allen, Jonathan, Wyatt, John L., Jr., White, Jacob K., Devadas, Srinivas, Armstrong, Robert C., Baltus, Donald G., Pickelsimer, Lisa A., Reichelt, Mark W., Tan, Chin Hwee, Van Aelten, Filip J., Horn, Berthold K. P., Lee, Hae-Seung, Masaki, Ichiro, Sodini, Charles G., Lumsdaine, Andrew, Rahmat, Khalid, Antoniadis, Dimitri A., Silveira, Luis M., Leeb, Steven B., Telichevsky, Ricardo, Dally, William J., Cai, Xuejun, Kamon, Mattan, Schmidt, Martin A., Senturia, Stephen D., Phillips, Joel R., van der Zant, Herre S. J., Orlando, Terry P., Kim, Songmin, Nabors, Keith S., Alidina, Mazhar M., Bhagwati, Vishal L., Bai, Kelly S., Liao, Stan Y., Monteiro, Jose C., Shen, Amelia H.Get full text
Published 2010
Technical Report -
9by Allen, Jonathan, Wyatt, John L., Jr., White, Jacob K., Devadas, Srinivas, Chandrakasan, Anantha P., Masaki, Ichiro, Dynes, Scott B. C., Ehrlich, Michael S., Terman, Christopher J., Horn, Berthold K. P., Lee, Hae-Seung, Schmidt, Martin A., Sodini, Charles G., Bergendahl, Jason R., Decker, Steven J., Frumkin, Stanislav E., Gealow, Jeffrey C., Martin, David A., Wang, Chig-Chun, Engels, Daniel W., Hadjiyiannis, George I., Hanono, Silvina Z., Fallah, Farzan, Beskok, Ali, Korsmeyer, F. Thomas, Lee, Chang Ho, Newman, J. Nicholas, Aluru, Narayana R., Senturia, Stephen D., Wang, Junfeng, Nastov, Ogden J., Phillips, Joel R., van der Zant, Herre S. J., Orlando, Terry P., Chou, Michael T., Kamon, Mattan, Massoud, Yehia M., Tausch, Johannes, Elfadel, Ibrahim M., Li, Jing-RebeccaGet full text
Published 2010
Technical Report -
10by Allen, Jonathan, Wyatt, John L., Jr., White, Jacob K., Devadas, Srinivas, Armstrong, Robert C., Baltus, Donald G., Ehrlich, Michael S., McDonald, Robert G., Tan, Chin Hwee, Horn, Berthold K. P., Lee, Hae-Seung, Sodini, Charles G., Masaki, Ichiro, Decker, Steven J., Elfadel, Ibrahim M., Herrmann, Frederick P., Martin, David R., McQuirk, Ignacio S., Oja, Erkki, Reichelt, Mark W., Seidel, Mark N., Silveira, Luis M., Umminger, Christopher B., Yu, Paul C., Lumsdaine, Andrew, Rahmat, Khalid, Antoniadis, Dimitri A., Cai, Xuejun, Kamon, Mattan, Yie, He, Schmidt, Martin A., Senturia, Stephen D., Phillips, Joel R., van der Zant, Herre S. J., Orlando, Terry P., Chou, Michael T., Massoud, Yehia M., Nabors, Keith S., Korsmeyer, F. Thomas, Nastov, Ognen J., Leeb, Steven B., Ouellette, Edward J., Monteiro, José C., Hadjiyiannis, George I., Liao, Stan Y.Get full text
Published 2010
Technical Report -
11by Allen, Jonathan, Wyatt, John L., Jr., White, Jacob K., Devadas, Srinivas, Chandrakasan, Anantha P., Masaki, Ichiro, Armstrong, Robert C., Baltus, Donald G., Dynes, Scott B. C., Ehrlich, Michael S., McDonald, Robert G., Tan, Chin Hwee, Horn, Berthold K. P., Lee, Hae-Seung, Schmidt, Martin A., Sodini, Charles G., Bergendahl, Jason R., Coram, Geoffrey J., Decker, Steven J., Gealow, Jeffrey C., Martin, David R., McQuirk, Ignacio S., Yu, Paul C., Hadjiyiannis, George I., Hanono, Silvina Z., Liao, Stan Y., Engels, Daniel W., Fallah, Farzan, Monteiro, José C., Lumsdaine, Andrew, Reichelt, Mark W., Rahmat, Khalid, Antoniadis, Dimitri A., Aluru, Narayana R., Kamon, Mattan, Senturia, Stephen D., Phillips, Joel R., van der Zant, Herre S. J., Orlando, Terry P., Chou, Michael T., Massoud, Yehia M., Nabors, Keith S., Tausch, Johannes, Korsmeyer, F. Thomas, Elfadel, Ibrahim M., Nastov, Ognen J.Get full text
Published 2010
Technical Report -
12by Allen, Jonathan, Wyatt, John L., Jr., White, Jacob K., Devadas, Srinivas, Armstrong, Robert C., Baltus, Donald G., McDonald, Robert G., Tan, Chin Hwee, Horn, Berthold K. P., Lee, Hae-Seung, Sodini, Charles G., Keast, Craig L., Masaki, Ichiro, Decker, Steven J., Dron, Lisa G., Elfadel, Ibrahim M., Hakkarainen, J. Mikko, Herrmann, Frederick P., Martin, David R., McQuirk, Ignacio S., Reichelt, Mark W., Seidel, Mark N., Silveira, Luis M., Umminger, Christopher B., Yu, Paul C., Lumsdaine, Andrew, Rahmat, Khalid, Antoniadis, Dimitri A., Cai, Xuejun, Kamon, Mattan, Yie, He, Schmidt, Martin A., Senturia, Stephen D., Phillips, Joel R., van der Zant, Herre S. J., Orlando, Terry P., Kim, Songmin, Nabors, Keith S., Chou, Michael T., Korsmeyer, F. Thomas, Leeb, Steven B., Alidina, Mazhar M., Bhagwati, Vishal L., Liao, Stan Y., Monteiro, José C., Rinderknecht, W. John, Shen, Amelia H.Get full text
Published 2010
Technical Report