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1by Allen, Jonathan, Wyatt, John L., Jr., White, Jacob K., Devadas, Srinivas, Chandrakasan, Anantha P., Masaki, Ichiro, Dynes, Scott B. C., Ehrlich, Michael S., Terman, Christopher J., Horn, Berthold K. P., Lee, Hae-Seung, Schmidt, Martin A., Sodini, Charles G., Bergendahl, Jason R., Decker, Steven J., Frumkin, Stanislav E., Gealow, Jeffrey C., Martin, David A., Wang, Chig-Chun, Engels, Daniel W., Hadjiyiannis, George I., Hanono, Silvina Z., Fallah, Farzan, Beskok, Ali, Korsmeyer, F. Thomas, Lee, Chang Ho, Newman, J. Nicholas, Aluru, Narayana R., Senturia, Stephen D., Wang, Junfeng, Nastov, Ogden J., Phillips, Joel R., van der Zant, Herre S. J., Orlando, Terry P., Chou, Michael T., Kamon, Mattan, Massoud, Yehia M., Tausch, Johannes, Elfadel, Ibrahim M., Li, Jing-RebeccaGet full text
Published 2010
Technical Report