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3by White, Jacob K., Newman, J. Nicholas, Korsmeyer, F. Thomas, Lee, Chango-Ho, Singer, Jürgen K., Farina, Leandro, Danmeier, Donald G., Hynes, Brodie J., Buchmann, Bjarne, Aluru, Narayana R., Beskok, Ali, Schmidt, Martin A., Senturia, Stephen D., Ramaswamy, Deepak, Wang, Junfeng, Nastov, Ognen J., Li, Jing-Rebecca, Tausch, Johannes, Balk, Igor, Chou, Michael T., Kamon, Mattan, Massoud, Yehia M., Phillips, Joel R.Get full text
Published 2010
Technical Report -
4by Allen, Jonathan, Wyatt, John L., Jr., White, Jacob K., Devadas, Srinivas, Armstrong, Robert C., Baltus, Donald G., Ehrlich, Michael S., McDonald, Robert G., Tan, Chin Hwee, Horn, Berthold K. P., Lee, Hae-Seung, Sodini, Charles G., Masaki, Ichiro, Decker, Steven J., Elfadel, Ibrahim M., Herrmann, Frederick P., Martin, David R., McQuirk, Ignacio S., Oja, Erkki, Reichelt, Mark W., Seidel, Mark N., Silveira, Luis M., Umminger, Christopher B., Yu, Paul C., Lumsdaine, Andrew, Rahmat, Khalid, Antoniadis, Dimitri A., Cai, Xuejun, Kamon, Mattan, Yie, He, Schmidt, Martin A., Senturia, Stephen D., Phillips, Joel R., van der Zant, Herre S. J., Orlando, Terry P., Chou, Michael T., Massoud, Yehia M., Nabors, Keith S., Korsmeyer, F. Thomas, Nastov, Ognen J., Leeb, Steven B., Ouellette, Edward J., Monteiro, José C., Hadjiyiannis, George I., Liao, Stan Y.Get full text
Published 2010
Technical Report -
5by Allen, Jonathan, Wyatt, John L., Jr., White, Jacob K., Devadas, Srinivas, Chandrakasan, Anantha P., Masaki, Ichiro, Armstrong, Robert C., Baltus, Donald G., Dynes, Scott B. C., Ehrlich, Michael S., McDonald, Robert G., Tan, Chin Hwee, Horn, Berthold K. P., Lee, Hae-Seung, Schmidt, Martin A., Sodini, Charles G., Bergendahl, Jason R., Coram, Geoffrey J., Decker, Steven J., Gealow, Jeffrey C., Martin, David R., McQuirk, Ignacio S., Yu, Paul C., Hadjiyiannis, George I., Hanono, Silvina Z., Liao, Stan Y., Engels, Daniel W., Fallah, Farzan, Monteiro, José C., Lumsdaine, Andrew, Reichelt, Mark W., Rahmat, Khalid, Antoniadis, Dimitri A., Aluru, Narayana R., Kamon, Mattan, Senturia, Stephen D., Phillips, Joel R., van der Zant, Herre S. J., Orlando, Terry P., Chou, Michael T., Massoud, Yehia M., Nabors, Keith S., Tausch, Johannes, Korsmeyer, F. Thomas, Elfadel, Ibrahim M., Nastov, Ognen J.Get full text
Published 2010
Technical Report