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1by Allen, Jonathan, Wyatt, John L., Jr., White, Jacob K., Devadas, Srinivas, Armstrong, Robert C., Baltus, Donald G., Ehrlich, Michael S., McDonald, Robert G., Tan, Chin Hwee, Horn, Berthold K. P., Lee, Hae-Seung, Sodini, Charles G., Masaki, Ichiro, Decker, Steven J., Elfadel, Ibrahim M., Herrmann, Frederick P., Martin, David R., McQuirk, Ignacio S., Oja, Erkki, Reichelt, Mark W., Seidel, Mark N., Silveira, Luis M., Umminger, Christopher B., Yu, Paul C., Lumsdaine, Andrew, Rahmat, Khalid, Antoniadis, Dimitri A., Cai, Xuejun, Kamon, Mattan, Yie, He, Schmidt, Martin A., Senturia, Stephen D., Phillips, Joel R., van der Zant, Herre S. J., Orlando, Terry P., Chou, Michael T., Massoud, Yehia M., Nabors, Keith S., Korsmeyer, F. Thomas, Nastov, Ognen J., Leeb, Steven B., Ouellette, Edward J., Monteiro, José C., Hadjiyiannis, George I., Liao, Stan Y.Get full text
Published 2010
Technical Report